Test and measurement equipment can be particularly affected by the quality and performance of power supplies. Electrical noise is a major concern because the speed and accuracy of test equipment rests greatly on its ability to minimize noise and keep it away from the sensitive electronics which sample and report the data that the equipment is designed to measure.
Test and measurement systems may be used for validating electronic circuits, testing electronic equipment, analyzing chemical substances, monitoring environmental conditions, or testing discrete components. Test equipment may be portable, in laboratories or on production floors so the environment where the equipment can be used is also critical when selecting a power supply.
We Power Industrial Applications That Matter
While our industrial power supplies can be used in a wide range of applications, we specialize in power supplies for automated testing, analytical instruments, electronics testing, automation, industrial robotics, and photonics. Industrial equipment designers have told us their challenges and we have listened. SL Power’s TU, TB, TE and TF Series power supplies were designed to address all of the main areas of concern, such as EMI performance, ESD protection, input surges, RF noise, and common-mode noise. In addition, these power supplies were designed to last as long as the end equipment, by using only high quality, long-life electrolytic capacitors well within their ratings. Some power supplies offer only some of these protections. The T Series models provide enhanced performance to all of the critical operational parameters.
Innovative Industrial Power Solutions
Programable output voltage and current
Forced current sharing
Selectable auxiliary output
In-rush current limiter
Long life electrolytic capacitors
Comprehensive protection features such as OVP, OCP, and OTP to safeguard your device under test (DUT)
Meeting Class B EMI levels with margin ensures less effort by the system designer to integrate a power supply into the end equipment.
Testing of the equipment itself during manufacture – same potential issues – failures due to unstable AC sources, etc., cause slower production throughput.
Common Mode Noise Attenuation and Characterization:
Minimizing CMN and providing data on the PS CMN performance minimizes the effort that designers expend in selecting and integrating power supplies into their equipment. No need to add complex filtering to allow optimum test equipment performance. Saves in material cost and development time.
7+ years (min) E-cap life
Use of high quality electrolytic capacitors well below their temperature and ESR ratings help extend the life of the end equipment and minimize field service needs.
5V @ 2A Output
5V @ 2A Standby Output
Used by many test system designers to perform start-up diagnostics and set-up before main output enabled. Also used to allow inhibit of the main output during no-load operation (equipment idle). 2 Amps requirement driven by more sophisticated electronics being used (microprocessors, etc.).
Ever-increasing silicon transition speeds and higher data rates mean that automated (or automatic) test equipment (ATE) must keep pace with the products to be tested. Complex technology such as functional testers, semiconductor testers, optical and x-ray inspection equipment forms an integral part of the electronics manufacturing process.
Research and material analysis labs use test and measurement analytical instruments such as spectrometers, chromatography machines, rheometers and thermal analysis apparatus. Laboratory equipment and scientific instruments operate in a strictly controlled environment, so the components used in their manufacture, such as power supplies, must meet exacting specifications.
Electrical and electronic test equipment, including multimeters, oscilloscopes, waveform generators, spectrum analyzers and test connectors are essential tools for design and maintenance engineers and field technicians. Electronic test equipment will typically create signals and capture responses from an electronic device under test (DUT).
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