Ever-increasing silicon transition speeds and higher data rates means that automated (or automatic) test equipment (ATE) must keep pace with the products to be tested. Complex technology such as functional testers, semiconductor testers, optical and x-ray inspection equipment forms an integral part of the electronics manufacturing process.
Automated test equipment is used in a range of production, manufacturing and assembly systems, including equipment for semiconductor testing, PCB inspection, optical inspection, boundary scan testing, and functional testing.
Automated test equipment, as with many types of test and measurement equipment, can be particularly affected by the quality and performance of power supplies. Electrical noise is a major concern because the speed and accuracy of test equipment rest greatly on its ability to minimize noise and keep it away from the sensitive electronics which sample and report the data that the equipment is designed to measure.